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LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only BAR DIGIT LED DISPLAY
LBD101/25-XX
DATA SHEET
DOC. NO REV. DATE
: :
QW0905- LBD101/25-XX A
: 13 - Feb. - 2006
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 1/7
Package Dimensions
1.75(0.069")
5.0 (0.197")
10.1 (0.398")
7.6 (0.299")
ORIENTATION MARK LBD101/25-XX LIGITEK
25.3(0.996")
8.0(0.315")
0.45 TYP
22.4(0.882")
6.00.5
PINNO.1
Note : 1.All dimension are in millimeters and (lnch) tolerance is 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 2/7
Internal Circuit Diagram
LBD1015-XX 20 19 18 17 16 15 14 13 12 11
1 2 3 4 5 6 7 8 9 10
LBD1025-XX 20 19 18 17 16 15 14 13 12 11
1 2 3 4 5 6 7 8 9 10
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 3/7
Electrical Connection
PIN NO. 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. Anode Anode Anode Anode Anode Anode Anode Anode Anode Anode
LBD1015-XX 11. 12. 13. 14. 15. 16. 17. 18. 19. 20. Cathode Cathode Cathode Cathode Cathode Cathode Cathode Cathode Cathode Cathode
PIN NO. 11. 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. Cathode Cathode Cathode Cathode Cathode Cathode Cathode Cathode Cathode Cathode
LBD1025-XX 11. 12. 13. 14. 15. 16. 17. 18. 19. 20. Anode Anode Anode Anode Anode Anode Anode Anode Anode Anode
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 4/7
Absolute Maximum Ratings at Ta=25
Ratings Parameter Symbol SR Forward Current Per Chip Peak Forward Current Per Chip (Duty 1/10,0.1ms Pulse Width) Power Dissipation Per Chip Reverse Current Per Any Chip Operating Temperature Storage Temperature IF IFP 30 mA UNIT
100
mA
PD Ir Topr Tstg
100 10 -25 ~ +85 -25 ~ +85
mW
A
Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260
Part Selection And Application Information(Ratings at 25)
Electrical
PART NO
common cathode Material Emitted or anode
CHIP Common Cathode
GaAlAs
P (nm)
(nm)
Vf(v)
Iv(mcd)
IV-M
Min. Typ. Max. Min. Typ.
LBD1015-XX Red
660 Common Anode
20
1.5
1.8
2.4
6.1
10.5
2:1
LBD1025-XX
Note : 1.The forward voltage data did not including 0.1V testing tolerance. 2. The luminous intensity data did not including 15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 5/7
Test Condition For Each Parameter
Parameter Forward Voltage Per Chip Luminous Intensity Per Chip Peak Wavelength Spectral Line Half-Width Reverse Current Any Chip Luminous Intensity Matching Ratio
Symbol Vf Iv
Unit volt mcd nm nm
Test Condition If=20mA If=10mA If=20mA If=20mA Vr=5V
P
Ir IV-M
A
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 6/7
Typical Electro-Optical Characteristics Curve
SR CHIP
Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current
3.0
1000
Forward Current(mA)
100
Relative Intensity Normalize @20mA
2.5 2.0 1.5 1.0 0.5 0.0
10 1.0
0.1 1.0 2.0 3.0 4.0 5.0
1.0
10
100
1000
Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature
Forward Current(mA) Fig.4 Relative Intensity vs. Temperature
3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100
Forward Voltage@20mA Normalize @25
1.1 1.0
0.9 0.8 -40 -20 0 20 40 60 80 100
Relative Intensity@20mA Normalize @25
1.2
Ambient Temperature()
Ambient Temperature()
Fig.5 Relative Intensity vs. Wavelength
Relative Intensity@20mA
1.0
0.5
0.0 600 650 700 750
Wavelength (nm)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LBD101/25-XX Page 7/7
Reliability Test:
Test Item
Test Condition
1.Under Room Temperature 2.If=10mA 3.t=1000 hrs (-24hrs, +72hrs)
Description
This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed.
Reference Standard
MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1
Operating Life Test
High Temperature Storage Test
1.Ta=105 5 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of high temperature for hours.
MIL-STD-883:1008 JIS C 7021: B-10
Low Temperature Storage Test
1.Ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
JIS C 7021: B-12
High Temperature High Humidity Test
1.Ta=65 5 2.RH=90 %~95 % 3.t=240hrs 2hrs
The purpose of this test is the resistance of the device under tropical for hours.
MIL-STD-202:103B JIS C 7021: B-11
Thermal Shock Test
1.Ta=105 5&-405 (10min) (10min) 2.total 10 cycles
The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire.
MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011
Solder Resistance Test
1.T.Sol=260 5 2.Dwell time= 10 1sec.
MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1
Solderability Test
1.T.Sol=230 5 2.Dwell time=5 1sec
This test intended to see soldering well performed or not.
MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2

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